Modern microscopic techniques

Dr. Margareta Pecovska-Gjorgjevik, Professor

Course content:

Introduction, electron optics. Electro-pattern interaction, secondary electrons, scattered electrons, and x-rays. Electron microscope construction. Image formation, interpretation, defects. Fundamentals and experimental methods in electro-optical techniques. Scanning electron microscope. Transmission electron microscopy: bright field, dark field with weak beam and high resolution, grating images, diffraction line indexing. Scanning electron microscopy resolution scanning, quantitative analysis of samples. 

Application in organic analysis. Application in forensics, semiconductor technology, nanotechnology, etc. Scanning test microscopy. Basic principles of Scanning Tunneling (STM) and Atomic Force Microscopy (AFM). Investigations of real surface and immersion electrolyte/electrode interfaces.

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